Multi-layer structure and sensor and manufacturing process
US6013365A · kind A · utility
36Cited by
1References
31Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 5, 1996 |
| Grant date | Jan 11, 2000 |
| Priority date | — |
| Expiry date | Dec 5, 2016 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T428/265
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
This invention relates to a multilayered magnetic structure comprising an alternate stack of: PA1 layers (6, 16) of a first type based on magnetic materials, PA1 layers (12) of a second type, made of Ag or an Ag rich alloy, PA1 a thin interface layer (8, 14) of Co or a Co rich alloy being located at the interface between layers of the first type and layers of the second type. The invention also relates to a process for making this type of structure. Applications to sensors based on magnetoresistive effects, such as current sensors or magnetic heads.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.