Patent · US Expired

Precursors for making low dielectric constant materials with improved thermal stability

US6020458A · kind A · utility

29Cited by
19References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 24, 1997
Grant dateFeb 1, 2000
Priority date
Expiry dateOct 24, 2017

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/26
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Fluorinated chemical precursors, methods of manufacture, polymer thin films with low dielectric constants, and integrated circuits comprising primarily of sp.sup.2 C-F and some hyperconjugated sp.sup.3 C-F bonds are disclosed in this invention. Precursors are disclosed for creating fluorinated silanes and siloxanes, and fluorinated hydrocarbon polymers. Thermal transport polymerization (TP), chemical vapor deposition (CVD), plasma enhanced CVD (PECVD), high density PECVD (HPCVD), photon assisted CVD (PACVD), and plasma-photon assisted (PPE) CVD and PPETP of these chemicals provides thin films with low dielectric constants and high thermal stabilities for use in the manufacture of integrated circuits.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.