Patent · US Expired

Electrically programmable anti-fuse circuit

US6020777A · kind A · utility

16Cited by
8References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 26, 1997
Grant dateFeb 1, 2000
Priority date
Expiry dateSep 26, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C17/16
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An array of anti-fuse cells forming rows and columns of a matrix is described. The anti-fuse cell includes an MOS capacitor connected to a source of high voltage which is capable of rendering the capacitor permanently conductive. A first voltage limiting transistor connects the free end of the MOS capacitor to a second transistor. An address decoder provides address signals to a source and gate of the second transistor within the cell. The MOS capacitor is rendered permanently conductive when the first and second transistors are rendered conductive. The high voltage is confined to the MOS capacitor, which is fused through the high current being drawn through the capacitor by the first and second transistors. Other components on the integrated circuit carrying the array of fusible cells are maintained free of any high voltage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.