Pattern generator for semiconductor test system
US6021515A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Apr 9, 1997 |
| Grant date | Feb 1, 2000 |
| Priority date | — |
| Expiry date | Apr 9, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A pattern generator to be used in a semiconductor test system for testing a semiconductor device having function modules common to other semiconductor devices and specific function modules unique to the semiconductor device under test includes, a first pattern generation block for generating test patterns for testing the common function modules in the semiconductor device under test, a second pattern generation block for generating test patters for testing said specific function modules in the semiconductor device under test, and a pattern combine circuit which is connected to the outputs of the first and second pattern generation blocks and transmits the test patterns from either one of the first or second pattern generation block, wherein the first pattern generation block sends a start signal to the second pattern generation block to initiate the operation of generating the module specific test patterns, and the second pattern generation block sends an end signal to the first pattern generation block to initiate the operation of the first pattern generation block.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.