Floating spring probe wireless test fixture

US6025729A · kind A · utility

Assignee

• Delaware Capital Formation, Inc. · US

Inventors

• David R. Van Loan · Diamond Bar, US
• Gary F. St. Onge · Ballston Lake, US
• Mark A. Swart · Upland, US

Key dates

• Filing date: Sep 11, 1997
• Grant date: Feb 15, 2000
• Expiry date: Sep 11, 2017

Classification

• Technology area (CPC H): Electricity
• CPC primary: H01L2924/0002
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A test fixture for a printed circuit board having a pattern of test probes and a fixed probe plate and a top plate adapted for movement toward and away from the probe plate. The probe plate and the top plate have selected patterns of holes for passage of the test probes through the probe plate and the top plate for contacting test points on the printed circuit board which is supported at one end of the test fixture. A probe retention sheet is positioned below the probe plate in an area of the test pins so that the test probes that extend through the probe plate also extends through the probe retention sheet, the probe retention sheet includes a preformed pattern of openings which are undersized with respect to an outside diameter of the test probes which extend through the pin retention sheet so that the retention sheet naturally applies a compression force around a circumference of the test probes extending through the sheet at a level sufficient to retain the test probes within the test fixture.