Patent · US Expired

Length measuring machine and method using laser beams

US6034773A · kind A · utility

2Cited by
2References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 9, 1998
Grant dateMar 7, 2000
Priority date
Expiry dateOct 9, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01C3/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

There is provided a length measuring machine which is not influenced by fluctuations of air or changes in temperature. At a structure, graduations are formed in a longitudinal direction, and further a built-in light wave interferometer is provided. The built-in light wave interferometer measures a length of the structure and supplies the data to a current controller. In order to reconcile a length of the structure with a nominal value, the current controller supplies current to an electrical resistor provided at the structure to cause thermal expansion of the structure, or the structure is cooled.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.