Patent · US Expired

Method of manufacturing shallow trench isolation

US6040232A · kind A · utility

28Cited by
7References
11Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 25, 1999
Grant dateMar 21, 2000
Priority date
Expiry dateJan 25, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76235
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method is described for manufacturing shallow trench isolation. The method comprises the steps of providing a substrate having a pad oxide layer, a mask layer, a trench penetrating through the mask layer and the pad oxide and into the substrate and a first liner oxide layer in the trench. A portion of the first liner oxide layer is stripped away to expose the bottom corner of the mask layer. A portion of the mask layer is stripped away to expose the top corner of the first oxide layer. The first liner oxide layer is removed to expose the surface of the trench. A second liner oxide layer is formed on the sidewall and the base surface of the trench and the trench is filled with an insulating material to form a shallow trench isolation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.