Method of constructing testing procedures for analog circuits by using fault classification tables
US6047114A · kind A · utility
0Cited by
4References
20Claims
0Family size
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Key dates
| Filing date | Aug 5, 1997 |
| Grant date | Apr 4, 2000 |
| Priority date | — |
| Expiry date | Aug 5, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/316
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention discloses a method of constructing the testing procedure of an analog circuit by applying the fault classification tables of the analog circuit. The constructing method classifies the fault classification tables to establish a decision tree. Entropy definitions are defined and the decision tree is thus established by following the rule of decreasing the entropy values. A search procedure of the decision tree can be performed as to find the failure mode next time when the analog circuit is detected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.