I-Shih Tseng
13Patents
3h-index
24Co-inventors
60Inventor score
Filing activity: Aug 5, 1997 → Jun 1, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6304119A | Timing generating apparatus with self-calibrating capability | Electricity | 9 | Expired |
| US7804589B2 | System and method for testing light-emitting devices | Physics | 7 | Active |
| US6035114A | Method for constructing fault classification tables of analog circuits | Physics | 6 | Expired |
| US8525996B2 | Light emitting component measuring system and the method thereof | Physics | 2 | Active |
| US9429617B2 | Testing apparatus for light emitting diodes | Physics | 2 | Active |
| US6925415B2 | Method and system for measuring characteristics of liquid crystal display driver chips | Physics | 1 | Expired |
| US12253541B2 | Pogo pin cooling system and method and electronic device testing apparatus having the system | Physics | 0 | Active |
| US9234933B2 | Solar cell testing system, solar cell testing method, and multifunctional testing light source | Emerging Cross-Sectional Technologies | 0 | Active |
| US12345741B2 | Wafer inspection method and inspection apparatus | Physics | 0 | Active |
| US6047114A | Method of constructing testing procedures for analog circuits by using fault classification tables | Physics | 0 | Expired |
| US11841381B2 | Wafer inspection method and inspection apparatus | Physics | 0 | Active |
| US12196806B2 | Aging test system and aging test method for thermal interface material and electronic device testing apparatus having the system | Physics | 0 | Active |
| US12385947B2 | Direct liquid cooling system for electronic devices in sockets, method, and electronic device testing apparatus comprising the same | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.