Patent · US Expired

Method of fabricating embedded dynamic random access memory

US6048762A · kind A · utility

11Cited by
7References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 6, 1998
Grant dateApr 11, 2000
Priority date
Expiry dateApr 6, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B12/31
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of fabricating an embedded dynamic random access memory. Using the method of dual damascence, by forming patterning only one dielectric layer, the contact windows with different depth are formed. In addition, the metal layer formed within the metal connecting regions are used as interconnects without further process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.