Electronic component test apparatus with rotational probe and conductive spaced apart means

US6051982A · kind A · utility

Assignee

• International Business Machines Corporation · US

Inventors

• David J. Alcoe · Vestal, US
• David V. Caletka · Apalachin, US

Key dates

• Filing date: Apr 9, 1997
• Grant date: Apr 18, 2000
• Expiry date: Apr 9, 2017

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R1/07392
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A test apparatus including at least one probe member precisely aligned using two spaced apart means (e.g., thin layers) such that the probe can effectively engage a conductor (e.g., solder ball) on an electronic module (e.g., ball grid array package). A compressible member (e.g., elastomeric body) is used to bias the probe toward the conductor. Various probe cross-sectional configurations are also provided. As taught herein, the probe electrically contacts one of the spaced apart means, also conductive, to thus form a circuit which can extend externally of the apparatus (e.g., for connecting to appropriate testing equipment).