Apparatus and method for characterizing pulsed light beams
US6052180A · kind A · utility
48Cited by
1References
22Claims
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Key dates
| Filing date | Feb 5, 1999 |
| Grant date | Apr 18, 2000 |
| Priority date | — |
| Expiry date | Feb 5, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B3/0006
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method for characterizing a pulsed energy beam with a two-dimensional wavefront sensor. The data acquisition is synchronized with the output of the beam from the pulsed source, so that a beam characterization, including phase, can be determined in a single pulse.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.