Patent · US Expired

Apparatus and method for characterizing pulsed light beams

US6052180A · kind A · utility

48Cited by
1References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 5, 1999
Grant dateApr 18, 2000
Priority date
Expiry dateFeb 5, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B3/0006
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus and method for characterizing a pulsed energy beam with a two-dimensional wavefront sensor. The data acquisition is synchronized with the output of the beam from the pulsed source, so that a beam characterization, including phase, can be determined in a single pulse.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.