Wavefront Sciences, Inc.
17Patents
0Active
17Granted
34Portfolio score
Filing activity: Feb 5, 1999 → Apr 21, 2006
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6550917B1 | Dynamic range extension techniques for a wavefront sensor including use in ophthalmic measurement | Physics | 147 | Expired |
| US6130419A | Fixed mount wavefront sensor | Physics | 67 | Expired |
| US6607274B2 | Method for computing visual performance from objective ocular aberration measurements | Human Necessities | 63 | Expired |
| US6184974A | Apparatus and method for evaluating a target larger than a measuring aperture of a sensor | Physics | 60 | Expired |
| US6908196B2 | System and method for performing optical corrective procedures with real-time feedback | Human Necessities | 59 | Expired |
| US6634750B2 | Tomographic wavefont analysis system and method of mapping an optical system | Human Necessities | 57 | Expired |
| US6052180A | Apparatus and method for characterizing pulsed light beams | Physics | 48 | Expired |
| US6819413B2 | Method and system for sensing and analyzing a wavefront of an optically transmissive system | Physics | 46 | Expired |
| US6376819B1 | Sub-lens spatial resolution Shack-Hartmann wavefront sensing | Physics | 37 | Expired |
| US6547395B1 | Methods of measuring moving objects and reducing exposure during wavefront measurements | Physics | 20 | Expired |
| US6624896B1 | System and method for metrology of surface flatness and surface nanotopology of materials | Physics | 11 | Expired |
| US7078665B2 | System and method of wavefront sensing for determining a location of focal spot | Physics | 8 | Expired |
| US6656373B1 | Apodized micro-lenses for Hartmann wavefront sensing and method for fabricating desired profiles | Physics | 7 | Expired |
| US7335867B2 | Method of wavefront sensing by mapping boundaries of a lenslet array onto a grid of pixels | Physics | 4 | Expired |
| US7122774B2 | System and method of wavefront sensing | Physics | 3 | Expired |
| US6790688B2 | Method of high pass filtering a data set | Physics | 2 | Expired |
| US6864043B2 | Apodized micro-lenses for Hartmann wavefront sensing and method for fabricating desired profiles | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.