Tester systems
US6064948A · kind A · utility
78Cited by
18References
26Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 2, 1998 |
| Grant date | May 16, 2000 |
| Priority date | — |
| Expiry date | Mar 2, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3191
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A tester for use with a device under test includes a processor, a signal timing editor to create representations of signal waveforms and associated times, and a test program executable on the processor that schedules events based on information from the signal timing editor. The test program schedules different delays for the events to compensate for variations in time delays between different signals coupled to the device under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.