Patent · US Expired

Tester systems

US6064948A · kind A · utility

78Cited by
18References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 2, 1998
Grant dateMay 16, 2000
Priority date
Expiry dateMar 2, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/3191
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A tester for use with a device under test includes a processor, a signal timing editor to create representations of signal waveforms and associated times, and a test program executable on the processor that schedules events based on information from the signal timing editor. The test program schedules different delays for the events to compensate for variations in time delays between different signals coupled to the device under test.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.