Jack C. Little
9Patents
8h-index
6Co-inventors
54Inventor score
Filing activity: Jul 16, 1997 → Jun 20, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5995424A | Synchronous memory test system | Physics | 120 | Expired |
| US5914902A | Synchronous memory tester | Physics | 87 | Expired |
| US6064948A | Tester systems | Physics | 78 | Expired |
| US6892328B2 | Method and system for distributed testing of electronic devices | Physics | 71 | Expired |
| US6182253A | Method and system for automatic synchronous memory identification | Physics | 58 | Expired |
| US5912852A | Synchronous memory test method | Physics | 32 | Expired |
| US5812472A | Nested loop method of identifying synchronous memories | Physics | 31 | Expired |
| US6067648A | Programmable pulse generator | Physics | 26 | Expired |
| US7149640B2 | Method and system for test data capture and compression for electronic device analysis | Physics | 6 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.