Method of making an efficient NPN turn-on in a high voltage DENMOS transistor for ESD protection
US6071768A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 8, 1997 |
| Grant date | Jun 6, 2000 |
| Priority date | — |
| Expiry date | May 8, 2017 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D89/711
Abstract
A high voltage DENMOS transistor (10) having improved ESD protection. The transistor (10) is optimized to provide maximum substrate current in order to turn on the inherent lateral npn transistor during an ESD event so that the lateral npn can dissipate the ESD event without damage to the transistor (10). This is accomplished by optimizing the overlap (A) of the drain extended region (16) and the gate electrode (28) to control the gate coupling to achieve maximum substrate current.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.