Patent · US Expired

Semiconductor memory device and method for fabricating the same

US6071770A · kind A · utility

13Cited by
13References
17Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 15, 1998
Grant dateJun 6, 2000
Priority date
Expiry dateMay 15, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D1/692
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor memory device suitable for forming a capacitor using a high dielectric film for a highly integrated semiconductor device includes a semiconductor substrate, an insulating film having a contact hole, the insulating film being over the semiconductor substrate, a conductive film on the semiconductor substrate through the contact hole, the conductive film having a top portion acting as a diffusion barrier, a first electrode over the conductive films, a dielectric film over the first electrode, and a second electrode over the dielectric film.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.