Sub-threshold leakage tuning circuit
US6091283A · kind A · utility
93Cited by
5References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 24, 1998 |
| Grant date | Jul 18, 2000 |
| Priority date | — |
| Expiry date | Feb 24, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05F3/205
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
To compensate for process, activity and temperature-induced device threshold variations in a semiconductor circuit having a transistor, a potential of the gate the transistor is held to a preset subthreshold potential, and a channel current of the channel region is compared with a reference current to obtain a comparison result. A bias potential of a substrate is adjusted according to the comparison result to hold the subthreshold current at the reference current.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.