Patent · US Expired

In-situ cleaning apparatuses for wafers used in integrated circuit devices and methods of cleaning using the same

US6092539A · kind A · utility

9Cited by
12References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 19, 1998
Grant dateJul 25, 2000
Priority date
Expiry dateMar 19, 2018

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S134/902
  • WIPO fieldChemical engineering
  • WIPO sectorChemistry

Abstract

Apparatuses for cleaning wafers used in integrated circuit devices comprise: (1) a dry cleaning section comprising inert gas storage bath, a hydrogen fluoride gas storage bath, and a vapor storage bath containing a component selected from the group consisting of water vapor, alcohol vapor, and mixtures thereof and a gas mixer, wherein the inert gas storage bath, the hydrogen fluoride gas storage bath, and the vapor storage bath are in communication with the gas mixer; (2) a wet cleaning section comprising a first bath for storing a fluoride; a second bath for storing a liquid alcohol; and a cleaning solution storage bath in communication with the first bath and second bath, wherein the fluoride and the liquid alcohol form a cleaning solution which is stored in the cleaning solution storage bath; and (3) a common cleaning bath positioned between and in communication with the dry cleaning section and the wet cleaning section.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.