Patent · US Expired

Method for manufacturing silicon carbide semiconductor device

US6096607A · kind A · utility

94Cited by
4References
12Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 17, 1998
Grant dateAug 1, 2000
Priority date
Expiry dateAug 17, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/256
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for manufacturing a silicon carbide semiconductor device having pn junctions is provided wherein a recessed portion is formed in a certain pattern in a surface of a substrate formed of a silicon carbide crystal, and an epitaxial layer having a conductivity type opposite to that of the substrate is grown on the substrate, and the surface of the surface is flattened so that the pn junctions appear on the surface of the substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.