Patent · US Expired

Method and apparatus for measuring micro structures, anisotropy and birefringence in polymers using laser scattered light

US6097488A · kind A · utility

57Cited by
9References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 22, 1998
Grant dateAug 1, 2000
Priority date
Expiry dateJun 22, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J4/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus for measuring microstructures, anistropy and birefringence in polymers using laser scattered light includes a laser which provides a beam that can be conditioned and is directed at a fiber or film which causes the beam to scatter. Backscatter light is received and processed with detectors and beam splitters to obtain data. The data is directed to a computer where it is processed to obtain information about the fiber or film, such as the birefringence and diameter. This information provides a basis for modifications to the production process to enhance the process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.