Patent · US Expired

Polishing pad for semiconductor wafer and method for polishing semiconductor wafer

US6099390A · kind A · utility

11Cited by
10References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 5, 1999
Grant dateAug 8, 2000
Priority date
Expiry dateApr 5, 2019

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B37/26
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A polishing pad used for polishing a film on a semiconductor wafer and made of a plastic includes a polishing pad body, and a large number of convex portions, which are provided on the surface of the polishing pad body just like so many islands and each have a flat top surface. An average length L of respective sides or diameters of the convex portions on the top surface thereof is in the range from 0.1 mm to 5.0 mm, both inclusive; an average height H of the convex portions is in the range from 0.1 mm to 0.5 mm, both inclusive; and H.ltoreq.L.ltoreq.2S is met, where S is an average space between the convex portions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.