Patent · US Expired

Method and apparatus for detecting and correcting anomalies in field-programmable gate arrays using CRCs for anomaly detection and parity for anomaly correction

US6101624A · kind A · utility

41Cited by
6References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 20, 1998
Grant dateAug 8, 2000
Priority date
Expiry dateJul 20, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/1008
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method and means for detecting and correcting anomalies in a RAM-based FPGA by comparing CRC residues over portions of the RAM-stored connection bitmap with prestored residues derived from uncorrupted copies of the same bitmap portions. A mismatch selectively invokes either error reporting to the chip only, error reporting and immediate verification testing of counterpart FPGA chip functions, or error reporting, parity-based correction of the words in error, reprogramming of the chip functions with the corrected words, and verification testing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.