Patent · US Expired

X-ray microfluorescence analyzer

US6108398A · kind A · utility

75Cited by
7References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 13, 1998
Grant dateAug 22, 2000
Priority date
Expiry dateJul 13, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2223/076
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An x-ray fluorescent analyzer and method for analyzing a sample, including an x-ray beam generator, which generates an x-ray beam incident at a spot on the sample, and creates a plurality of fluorescent x-ray photons. There are a plurality of semiconducting detectors arrayed around the spot so as to capture the fluorescent x-ray photons and in response produce a plurality of electrical pulses suitable for analysis of the sample.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.