Patent · US Expired

Semiconductor device having timing-stabilization circuit and method of testing such semiconductor device

US6108793A · kind A · utility

30Cited by
4References
73Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 18, 1998
Grant dateAug 22, 2000
Priority date
Expiry dateMar 18, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03L7/095
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A method of measuring a time which a timing-stabilization circuit requires in order to complete timing stabilization with regard to a semiconductor device provided with a first function to reset the timing-stabilization circuit and a second function to output a signal indicative of completion of the timing stabilization is disclosed. The method includes the steps of a) activating the timing-stabilization circuit, b) detecting a timing of the completion of the timing stabilization by using the second function, and c) measuring the time which the timing-stabilization circuit requires to complete the timing stabilization based on the timing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.