Nobutaka Taniguchi
15Patents
10h-index
21Co-inventors
68Inventor score
Filing activity: Aug 28, 1997 → Oct 8, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6181174A | Semiconductor integrated circuit device | Electricity | 72 | Expired |
| US6242954A | Timing clock generation circuit using hierarchical DLL circuit | Electricity | 49 | Expired |
| US5901101A | Semiconductor memory device | Physics | 46 | Expired |
| US6194932A | Integrated circuit device | Electricity | 40 | Expired |
| US6108793A | Semiconductor device having timing-stabilization circuit and method of testing such semiconductor device | Electricity | 30 | Expired |
| US6522182B2 | Integrated circuit device incorporating DLL circuit | Electricity | 22 | Expired |
| US6288585A | Semiconductor device using external power voltage for timing sensitive signals | Electricity | 19 | Expired |
| US6031788A | Semiconductor integrated circuit | Physics | 19 | Expired |
| US6225843A | Semiconductor integrated circuit device | Electricity | 11 | Expired |
| US7184296B2 | Memory device | Physics | 10 | Expired |
| US7106114B2 | Delay time adjusting method of delaying a phase of an output signal until a phase difference between an input signal and the output signal becomes an integral number of periods other than zero | Electricity | 5 | Expired |
| US7307885B2 | Multi-value nonvolatile semiconductor memory device equipped with reference cell and load balancing circuit | Physics | 1 | Expired |
| US9325330B2 | Semiconductor device including a clock adjustment circuit | Electricity | 0 | Active |
| US7667509B2 | Delay time adjusting method of delaying a phase of an output signal until a phase difference between an input signal and the output signal becomes an integral number of periods other than zero | Electricity | 0 | Expired |
| US7643371B2 | Address/data multiplexed device | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.