Patent · US Expired

Pastes for improved substrate dimensional control

US6117367A · kind A · utility

8Cited by
17References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 9, 1998
Grant dateSep 12, 2000
Priority date
Expiry dateFeb 9, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05K1/092
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Metal pastes used in the fabrication of multilayer ceramic (MLC) substrates used in semiconductor devices. The pastes reduce substrate defects, such as via bulge and camber. The pastes are comprised of a metal having high conductivity, frit which includes glass, an organic binder, and a solvent, optionally with a surfactant.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.