Patent · US Expired

Method for making a complementary metal gate electrode technology

US6130123A · kind A · utility

122Cited by
1References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 30, 1998
Grant dateOct 10, 2000
Priority date
Expiry dateJun 30, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/0177

Abstract

A method for making a circuit device that includes a first transistor having a first metal gate electrode overlying a first gate dielectric on a first area of a semiconductor substrate. The first gate electrode has a work function corresponding to the work function of one of P-type silicon and N-type silicon. The circuit device also includes a second transistor coupled to the first transistor. The second transistor has a second metal gate electrode over a second gate dielectric on a second area of the semiconductor substrate. The second gate metal gate electrode has a work function corresponding to the work function of the other one of P-type silicon and N-type silicon.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.