Patent · US Expired

Miniaturized secondary electron detector

US6130429A · kind A · utility

8Cited by
1References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 23, 1998
Grant dateOct 10, 2000
Priority date
Expiry dateNov 23, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/2448
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

To miniaturize a secondary-electron detector, a ring-shaped secondary-electron emissive material layer 44A is formed on a ring-shaped base 41 having a round hole 41a, via a ring-shaped insulating layer 42A and a ring-shaped high resistance layer 43A. Similarly, a ring-shaped secondary-electron emissive material layer 44B is formed on a ring-shaped base 33 having a round hole 33a, via a ring-shaped insulating layer 42B and a ring-shaped high resistance layer 43B. A arc-shaped multiplied-electron collecting electrode 461 is joined between the insulating layers 42A and 42B outside the secondary-electron emissive material layer 44B. A porous secondary-electron multiplication substance may be filled between opposed bases instead of the secondary-electron emissive material layers 44A and 44B, and an optical fiber coated with phosphor may be used instead of the electrode 461.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.