Patent · US Expired

Electrically alterable antifuse using FET

US6130469A · kind A · utility

41Cited by
10References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 24, 1998
Grant dateOct 10, 2000
Priority date
Expiry dateApr 24, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An integrated circuit and fabrication method for an antifuse structure that includes a shallow trench oxide isolation region disposed in a silicon substrate, the oxide in the trench having a top surface recessed below the surface of the substrate to form sharp corners at each side of the trench. The substrate includes diffusion regions adjacent to the sharp corners, electrical insulation layers over the diffusion regions, and an electrical conductor is disposed over the recessed oxide in the trench. When voltage is applied on the electrical conductor, a high field point is produced at the sharp corners causing the electrical insulation layer at the corners to break down and create a short circuit between the electrical conductor and the diffusions, thus providing a fuse function.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.