Patent · US Expired

Use of intersecting subresolution features for microlithography

US6139994A · kind A · utility

61Cited by
10References
33Claims
0Family size

Inventors

Key dates

Filing dateJun 25, 1999
Grant dateOct 31, 2000
Priority date
Expiry dateJun 25, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F1/50
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A method for creating an image on an image plane utilizing a photomask comprised of a plurality of intersecting subresolution features. Energy created by an energy source is projected through the subresolution features which diffract the light to produce constructive or positive interference thereby resulting in an image being formed on the image plane that is different than the image or pattern of subresolution features on the photomask.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.