Inventor · Sunnyvale, CA, US

Doug Broeke

2Patents
1h-index
3Co-inventors
33Inventor score

Filing activity: Jun 25, 1999 → Sep 11, 2003

Most-cited inventions

PatentTitleAreaCited byStatus
US6139994A Use of intersecting subresolution features for microlithography Physics 61 Expired
US7211815B2 Method of achieving CD linearity control for full-chip CPL manufacturing Physics 1 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.