Ion-trap mass analyzing apparatus and ion trap mass analyzing method
US6140641A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 2, 1998 |
| Grant date | Oct 31, 2000 |
| Priority date | — |
| Expiry date | Jun 2, 2018 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/4275
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
An numerical analysis time which is assigned to mass select one ion species having a specific mass-to-charge ratio mass selected is divided into the first part time and the second part time, and a dipole auxiliary electric field capable of spatially reducing a spread is superimposed in the first part time of the numerical analysis time and a quadrupole auxiliary voltage capable of rapidly emitting ions when position coordinates are large is superimposed in the second part of the time. Therefore, the initial spatial spread is reduced in the first part time and the trajectories of ions is rapidly amplified in the second part time, and the ions are emitted. Thus, the entire mass sweep time can be reduced and a high-resolution numerical analysis can be accelerated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.