Yoichi Ose
72Patents
15h-index
87Co-inventors
87Inventor score
Filing activity: Jun 20, 1989 → Dec 22, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5668368A | Apparatus for suppressing electrification of sample in charged beam irradiation apparatus | Electricity | 72 | Expired |
| US6847038B2 | Scanning electron microscope | Electricity | 67 | Expired |
| US5608218A | Scanning electron microscope | Electricity | 43 | Expired |
| US6646262B1 | Scanning electron microscope | Electricity | 31 | Expired |
| US6946656B2 | Sample electrification measurement method and charged particle beam apparatus | Electricity | 31 | Expired |
| US5576538A | Apparatus and method for ion beam neutralization | Electricity | 28 | Expired |
| US5894124A | Scanning electron microscope and its analogous device | Electricity | 28 | Expired |
| US6667476B2 | Scanning electron microscope | Electricity | 23 | Expired |
| US6043491A | Scanning electron microscope | Electricity | 23 | Expired |
| US5466929A | Apparatus and method for suppressing electrification of sample in charged beam irradiation apparatus | Electricity | 19 | Expired |
| US6501077B1 | Scanning electron microscope | Electricity | 17 | Expired |
| US5756993A | Mass spectrometer | Physics | 16 | Expired |
| US6787772B2 | Scanning electron microscope | Electricity | 16 | Expired |
| US6872944B2 | Scanning electron microscope | Electricity | 16 | Expired |
| US6121610A | Ion trap mass spectrometer | Electricity | 15 | Expired |
| US5633496A | Mass spectrometry apparatus | Physics | 14 | Expired |
| US5623144A | Mass spectrometer ring-shaped electrode having high ion selection efficiency and mass spectrometry method thereby | Electricity | 14 | Expired |
| US6885001B2 | Scanning electron microscope | Electricity | 12 | Expired |
| US7075078B2 | Scanning electron microscope | Electricity | 11 | Expired |
| US6982427B2 | Electron beam apparatus with aberration corrector | Electricity | 10 | Expired |
| US7087899B2 | Sample electrification measurement method and charged particle beam apparatus | Electricity | 10 | Expired |
| US5677530A | Scanning electron microscope | Electricity | 10 | Expired |
| US6555819B1 | Scanning electron microscope | Electricity | 9 | Expired |
| US6140641A | Ion-trap mass analyzing apparatus and ion trap mass analyzing method | Electricity | 9 | Expired |
| US7022983B2 | Monochromator and scanning electron microscope using the same | Electricity | 9 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.