Patent · US Expired

Fabrication method for increasing the coupling efficiency of ETOX flash memory devices

US6153904A · kind A · utility

18Cited by
12References
30Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 4, 1998
Grant dateNov 28, 2000
Priority date
Expiry dateDec 4, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/6891

Abstract

A method of manufacturing an electron tunnel oxide (ETOX) flash memory device having an improved coupling efficiency includes sequentially forming a tunnel oxide, a floating gate, a dielectric layer, and a control gate on a substrate, where the tunnel oxide and the bottom of the floating gate are formed to be narrower than the top of the floating gate, the dielectric and the control gate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.