Method and apparatus for detecting Mura defects
US6154561A · kind A · utility
43Cited by
9References
38Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 4, 1998 |
| Grant date | Nov 28, 2000 |
| Priority date | — |
| Expiry date | Feb 4, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30161
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for locating blobs in an image, includes the steps of: forming a blob reference mask from the image, the blob reference mask including a portion indicating a portion of the image containing a first blob, if any, and forming a reference image from the image, the reference image corresponding to the image. The method also includes the steps of forming a modified image from the image by replacing the portion of the image containing the first blob, if any, with a portion of the reference image corresponding to the portion of the image, and locating a second blob in the image in response to the modified image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.