Pattern similarity metric for image search, registration, and comparison
US6154567A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jul 1, 1998 |
| Grant date | Nov 28, 2000 |
| Priority date | — |
| Expiry date | Jul 1, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30148
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention provides a method for the calculation of a pattern similarity metric that is locally normalized with respect to illumination intensity, and is invariant with respect to rigid body preserving gray scale variations, such as scale, rotation, translation, and non-linear intensity transformations. In one aspect, the invention provides a method for comparing a model image with a run-time image so as to provide a quantitative measure of image similarity. In another general aspect of the invention, a method is provided for searching a run-time image with a model image so as to provide at least one location of the model image within the run-time image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.