Patent · US Expired

Method for producing a silicon capacitor

US6165835A · kind A · utility

3Cited by
3References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 20, 1999
Grant dateDec 26, 2000
Priority date
Expiry dateJul 20, 2019

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/96

Abstract

In producing a silicon capacitor, hole structures (2) are created in a silicon substrate (1), at the surface of which structures a conductive zone (3) is created by doping and whose surface is provided with a dielectric layer (4) and a conductive layer (5), without filling the hole structures (2). To compensate mechanical strains upon the silicon substrate (1) which are effected by the doping of the conductive zone (3), a conformal auxiliary layer (6) is formed on the surface of the conductive layer (5), which auxiliary layer is under a compressive mechanical stress.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.