Patent · US Expired

Die attach pad adapted to reduce delamination stress and method of using same

US6169322A · kind A · utility

5Cited by
3References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 6, 1998
Grant dateJan 2, 2001
Priority date
Expiry dateMar 6, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/181
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The invention enables a die to be attached to a die attach pad so as to reduce delamination stress that can arise when the die and die attach pad are heated, and so as to provide support for the die at locations where bond pads are formed so that the die is not damaged by forces applied to the die during attachment of bond wires to the bond pads. The die and die attach pad so attached can be used to produce a packaged die having improved delamination characteristics, so that the cost to manufacture and/or store the packaged die can be reduced. The invention further provides die attach pads and leadframes including such die attach pads that are particularly suited to achieving the aforementioned functional characteristics.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.