Patent · US Expired

Method and apparatus for reducing standby leakage current using a transistor stack effect

US6169419A · kind A · utility

55Cited by
12References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 10, 1998
Grant dateJan 2, 2001
Priority date
Expiry dateSep 10, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03K19/0016
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

Reduction of standby leakage current in an internal circuit block using a transistor stack effect. For one embodiment, an apparatus includes a standby leakage reduction circuit to be coupled to the circuit block including a plurality of logic gates. The standby leakage reduction circuit causes a stack effect at each of the plurality of logic gates during a standby mode of the circuit block by turning off two or more series-coupled transistors of a same type (either n-type or p-type) at each of the plurality of logic gates.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.