Method and apparatus for measuring material properties using transient-grating spectroscopy
US6175421A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 25, 1999 |
| Grant date | Jan 16, 2001 |
| Priority date | — |
| Expiry date | May 25, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/636
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention provides an apparatus for measuring a property of a sample (using, e.g., ISTS) that includes: 1) an excitation laser that generates an excitation laser beam; 2) an optical system aligned along an optical axis that separates the excitation laser beam into at least three sub-beams; 3) an imaging system aligned along the optical axis that collects the sub-beams and focuses them onto the sample to form an optical interference pattern that generates a time-dependent response in the sample; 4) a probe laser that generates a probe laser beam that diffracts off the time-dependent response to form a signal beam; 5) a detector that detects the signal beam and in response generates a radiation-induced electronic response; and 6) a processor that processes the radiation-induced electronic response to determine the property of the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.