Active Impulse Systems, Inc.
9Patents
0Active
9Granted
29Portfolio score
Filing activity: Jan 15, 1997 → May 11, 2000
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6081330A | Method and device for measuring the thickness of opaque and transparent films | Physics | 74 | Expired |
| US5812261A | Method and device for measuring the thickness of opaque and transparent films | Physics | 72 | Expired |
| US6348967B1 | Method and device for measuring the thickness of opaque and transparent films | Physics | 54 | Expired |
| US6256100A | Method and device for measuring the thickness of thin films near a sample's edge and in a damascene-type structure | Physics | 46 | Expired |
| US6052185A | Method and apparatus for measuring the concentration of ions implanted in semiconductor materials | Physics | 43 | Expired |
| US6069703A | Method and device for simultaneously measuring the thickness of multiple thin metal films in a multilayer structure | Physics | 33 | Expired |
| US6175421A | Method and apparatus for measuring material properties using transient-grating spectroscopy | Physics | 31 | Expired |
| US6118533A | Method and apparatus for measuring the concentration of ions implanted in semiconductor materials | Physics | 15 | Expired |
| US6075602A | Method and apparatus for measuring material properties using transient-grating spectroscopy | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.