Machine vision system for object feature analysis and validation based on multiple object images
US6175644A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 1, 1998 |
| Grant date | Jan 16, 2001 |
| Priority date | — |
| Expiry date | May 1, 2018 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T117/1004
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided is the ability to validate detected features in acquired images to thereby enhance the integrity of any analysis carried out on the detected and validated features. A sequence of images of, e.g., an object is acquired, each image in the sequence corresponding to a distinct orientation of the object about a selected object axis. Images in the sequence are inspected for feature points of the selected feature plane, as-projected into the images, at a first feature detection location and at a second feature detection location. The second feature detection location is configured at an image position at which a feature point detected in the first feature detection location in a first inspected image is expected to appear in a second inspected image. Valid object feature points are identified as being those feature points which are detected in both the first feature detection location in a first inspected image and in the second feature detection location in a second inspected image of the image sequence. Features that are validated are not likely to be time-dependent noise and are preserved for further feature analysis, while extraneous data is rendered transparent to feature an…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.