Integrated circuit testing device with dual purpose analog and digital channels
US6175939A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Mar 30, 1999 |
| Grant date | Jan 16, 2001 |
| Priority date | — |
| Expiry date | Mar 30, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31924
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit (IC) tester includes a set of dual-purpose digital/analog channels. Each tester channel includes a driver capable of supplying either a digital or analog test signal input to an IC terminal and a receiver for digitizing and processing either an analog or digital IC output signal appearing at the DUT terminal to produce results data representing the behavior of that IC output signal during a test. A test is organized into a succession of test cycles, and before each test cycle a pattern generator within each channel produces data for controlling the behavior of the driver and receiver during the test cycle. The control data controls whether the driver is to produce an analog or a digital test signal, controls a magnitude or logic level to which the test signal is to be driven during the test cycle, and controls a time during the test cycle of any test signal state or magnitude changes. The control data also indicates how and when the receiver digitizes and processes an IC output signal during the test cycle.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.