Patent · US Expired

System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic test equipment

US6191570A · kind A · utility

1Cited by
11References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 26, 1999
Grant dateFeb 20, 2001
Priority date
Expiry dateJul 26, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/3191
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for testing node isolation on a circuit board. The method utilizes an automated test system having a plurality of test channels, wherein each test channel has a digital driver with a first input and a first output, and a digital receiver with a second output and a second input. The second input of the receiver is coupled to the first output of the driver, to a number of switches, and to a test probe. The test probe is configured to couple the driver and receiver to one of a plurality of nodes on a circuit board. The number of switches are configured to selectively couple the first output and second input to ground. During a node isolation test, each node of a test node group is coupled to one of the test channels. But for a selected node of the test node group, each node of the test node group is coupled to ground via the number of switches of the test channels coupled to the nodes. Thereafter, a test signal is applied to the selected node via the digital driver of a first test channel which is coupled to the selected node. It is then determined if the digital receiver of the first test channel indicates that the selected node is coupled to ground, and whether the selected…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.