Inventor · Loveland, CO, US

Bryan D. Boswell

14Patents
5h-index
15Co-inventors
63Inventor score

Filing activity: Aug 31, 1993 → Dec 11, 2016

Most-cited inventions

PatentTitleAreaCited byStatus
US5504432A System and method for detecting short, opens and connected pins on a printed circuit board using automatic test equipment Physics 17 Expired
US6563297B1 RF isolation test device having ease of accessibility Electricity 16 Expired
US5977775A System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic equipment Physics 13 Expired
US6291978A System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic test equipment Physics 9 Expired
US6469495B1 RF isolation test device accommodating multiple nest plates for testing different devices and providing variable testing options Physics 8 Expired
US6545459B2 RF isolation test device accommodating multiple nest plates for testing different devices and providing variable testing options Physics 4 Expired
US6377038B1 RF isolation test device having a box within a box configuration for RF sheilding reference to related applications Electricity 4 Expired
US6051979A System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic test equipment Physics 4 Expired
US6751570B2 RF fixture electronics for testing RF devices Physics 3 Expired
US7977996B1 Pulse generator with precision edge placement Electricity 3 Active
US6813646B2 Controlling electronics across an RF barrier using a serial interface bus Physics 1 Expired
US6191570A System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic test equipment Physics 1 Expired
US8922957B2 Dynamic switch contact protection Physics 0 Active
US10330715B2 Systems and methods for determining a self-discharge current characteristic of a storage cell Emerging Cross-Sectional Technologies 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.