Adapter for a measurement test probe

US6191594A · kind A · utility

Assignee

• Tektronix, Inc. · US

Inventors

• Mark W. Nightingale · Camas, US
• Marc A. Gessford · Portland, US
• Richard J. Huard · Beaverton, US

Key dates

• Filing date: Oct 28, 1996
• Grant date: Feb 20, 2001
• Expiry date: Oct 28, 2016

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R1/0425
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A probe adapter for coupling probe tip contacts of a electrical measurement probe to leads of a surface mounted integrated circuit IC device has an insulating housing from which extend first and second flexible electrically conductive leads having a pitch geometry compatible with the leads of the IC device. First and second electrical contacts, respectively coupled to the first and second flexible electrically conductive leads, are disposed in the housing and have a pitch geometry compatible with the probe tip contacts of the electrical measurement probe.