Mark W. Nightingale
23Patents
11h-index
25Co-inventors
71Inventor score
Filing activity: Jun 13, 1990 → May 4, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6402565B1 | Electronic interconnect device for high speed signal and data transmission | Electricity | 25 | Expired |
| US6175080A | Strain relief, pull-strength termination with controlled impedance for an electrical cable | Electricity | 25 | Expired |
| US6400167B1 | Probe tip adapter for a measurement probe | Physics | 24 | Expired |
| US6603297B1 | Probe tip adapter for a measurement probe | Physics | 24 | Expired |
| US6191594A | Adapter for a measurement test probe | Physics | 23 | Expired |
| US6404215B1 | Variable spacing probe tip adapter for a measurement probe | Physics | 23 | Expired |
| US5387872A | Positioning aid for a hand-held electrical test probe | Physics | 19 | Expired |
| US6466000B1 | Replaceable probe tip holder and measurement probe head | Physics | 17 | Expired |
| US5061892A | Electrical test probe having integral strain relief and ground connection | Emerging Cross-Sectional Technologies | 13 | Expired |
| USD344681S | Head assembly for a switchable electrical test probe | General | 11 | Expired |
| US6459287B1 | Attachable/detachable probing point | Physics | 11 | Expired |
| USD354923S | Probing head for an electrical test probe | General | 9 | Expired |
| USD334147S | Electrical test probe | General | 8 | Expired |
| US6218826A | Measurement probe having an internal alignment fixture | Physics | 6 | Expired |
| USD346122S | Probing head for an electrical test probe | General | 6 | Expired |
| USD346338S | Electrical test probe | General | 6 | Expired |
| US8067718B2 | Method and apparatus for probing | Physics | 5 | Active |
| US5220274A | Surface mounted electrical switch and probe structure | Physics | 5 | Expired |
| US6614221B2 | Deskew fixture | Physics | 4 | Expired |
| US7362112B2 | Signal acquisition probe having a retractable double cushioned probing tip assembly | Physics | 3 | Expired |
| US6659812B2 | Surface mount probe point socket and system | Physics | 3 | Expired |
| US6600330B1 | Probe head holder | Physics | 2 | Expired |
| US6989492B2 | Inverted strain relief | Electricity | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.