Patent · US Expired

Method and apparatus for grinding wafers using a grind chuck having high elastic modulus

US6193586A · kind A · utility

14Cited by
8References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 24, 1998
Grant dateFeb 27, 2001
Priority date
Expiry dateDec 24, 2018

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B55/02
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A method and apparatus for grinding wafers without using an ultraviolet tape attached to the front face of the wafer reduces manufacturing costs, simplifies the grinding process and protects the semiconductor chips formed on the front face of the wafer from being damaged by static electricity. The grinding apparatus uses a grind chuck formed of a soft material having a high elastic modulus and a rising groove formed in the grind chuck. Deionized water is supplied onto the wafer from a first direction. Simultaneously, deionized water or air is supplied into the rising groove of the grind chuck from a second direction opposite to the first direction. The circumferential edge of the wafer overlaps the rising groove, such that the simultaneous supply of deionized water and/or air from the two directions protects the front surface of the wafer from being contaminated by silicon dust. The soft material of the grind chuck also protects the front surface of the wafer from being damaged by pressure from the grind unit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.