Patent · US Expired

Methods and apparatus for improving resolution and reducing noise in an image detector for an electron microscope

US6194719A · kind A · utility

5Cited by
9References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 12, 1998
Grant dateFeb 27, 2001
Priority date
Expiry dateJun 12, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/2445
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

Methods and apparatus are provided which improve the performance of electron imaging detectors by reducing the total interaction volume of the detector and/or reducing the energy converting volume of the detector. In one embodiment, a method for improving resolution and reducing noise in an imaging electron detector for an electron microscope is provided and includes the step of decelerating the energetic electrons either before the electrons interact with, or as the electrons interact with, the energy converting volume of an imaging electron detector. In other embodiments, the lateral spatial travel of energetic electrons is limited as they traverse the imaging electron detector, or, the extent of electron back scatter from the energetic electrons is limited.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.